Cadence Experiences Management Changes – Again
Long-time Cadence CTO – Ted Vucurevich – will be leaving. The reasons behind his departure may give clues to Cadence’s future technology direction. The departure of Vucurevich, Cadence’s tech savvy...
View ArticleWhat does Carl Icahn really want from Mentor?
Whether it is short term gain or long term growth, Mentor’s latest suitor will need a deep understanding of the EDA market and its players to be successful. Have you seen the increasing coverage about...
View ArticleImpressions from ESC 2011
By John Blyler Here are my rough impressions from the last four days of attendance at the Embedded Systems Conference. The weather was warm and inviting as is shined through the large windows at the...
View ArticleBlacker Boxes Lie Ahead
Few pundits have addressed the system engineering development implications of the recent EDA and semiconductor company’s move toward platforms that include both chip hardware with associated firmware...
View ArticleSocial and Mobile Players Change the Game
The rise of the social, mobile Alpha-Influencers segment opens new horizons for the game-related technology and content-services industries. The stellar growth of social media and mobile devices has...
View ArticleSystems, Software and IP Merge at DAC
Here’s the first day of DAC, captured in pictures and captions.
View ArticleSTMicroelectronics Pushes SOI While Leaving the Mobile Space
Why is one of Europe’s leading semiconductor IDMs pushing into leading-edge, 28-nm FD-SOI technology while leaving a market where such technology might be useful? It was a chance meeting that made me...
View ArticleMoore’s Cycle, Fifth Horseman, Mixed Signals, and IP Stress
What do all of these things have in common? They were key topics addressed by Cadence, Samsung, and others at CDNLive 2013. What does Cadence see as the future trends and challenges facing the...
View ArticleOur Day at DAC – Day 1 (Monday)
Here are the brief observations on noteworthy presentations, cool demonstrations and hall-way chats from the editorial staff covering “Day 1″ at DAC 2014 – John Blyler, Gabe Moretti and Hamilton...
View ArticleEDA Tool Reduces Chip Test Time With Same Die Size
Cadence combines physically-aware scan logic with elastic decompression in new test solution. What does that really mean? By John Blyler, Editorial Director Cadence recently announced the Modus Test...
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